Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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**Peak force frequency: 2 Hz | **Peak force frequency: 2 Hz | ||
**Rq: 0.247 nm | **Rq: 0.247 nm | ||
#ScanAsyst with ScanAsyst-air | ##ScanAsyst with ScanAsyst-air | ||
**CL off | **CL off | ||
**512x512 | **512x512 | ||