Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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256 lines <br> | 256 lines <br> | ||
Z range at 2my to get sub nanometer resolution in Z <br> | Z range at 2my to get sub nanometer resolution in Z <br> | ||
Rq: | Rq: 28 nm | ||
[[File:System noise.JPG|400px]] | [[File:System noise.JPG|400px]] | ||
<br clear="all" /> | <br clear="all" /> | ||