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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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===Noise tests===
===Noise tests===
====Sensor noise====
====Sensor noise====
Tappingmode, OTESPA-R3 probe used. <br>
Tapping ]mode, OTESPA-R3 probe used. <br>
First we made a false engage (scanning in air):
First we made a false engage (scanning in air):
Turn off gain 0 0 <br>
Turn off gain 0 0 <br>
Z range 0.2my <br>
Z range 0.2my <br>
Scan size 0.01nm <br>
Scan size 0.01nm <br>
We saw some 50Hz noise (electrical - or maybe pumps): Rq 15 pm (specs 35pm) <br>
Roughness: Rq 27 pm (specs 35pm) <br>
[[File:SensorNoise.jpg|thumb|left|400px]] <br clear="all" />
[Media:scanner noise.JPG|400px]
<br clear="all" />


====System noise====
====System noise====
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