Specific Process Knowledge/Thin film deposition/Deposition of Titanium Oxide: Difference between revisions
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==Deposition of Titanium Oxide== | ==Deposition of Titanium Oxide== | ||
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!Sputter technique using [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab300]] | !Sputter technique using [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab300]] | ||
![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]] | ![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]] | ||
![[Specific Process Knowledge/Thin film deposition/ALD Picosun R200|ALD Picosun 200]] | ![[Specific Process Knowledge/Thin film deposition/ALD Picosun R200|ALD Picosun 200]] | ||
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*Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma. | *Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma. | ||
*RF sputtering of TiO2 target | *RF sputtering of TiO2 target | ||
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*ALD (atomic layer deposition) of TiO<sub>2</sub> | *ALD (atomic layer deposition) of TiO<sub>2</sub> | ||
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*Can probably be varied (sputter target: Ti, O2 added during deposition) | *Can probably be varied (sputter target: Ti, O2 added during deposition) | ||
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*unknown | *unknown | ||
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*~10 nm - ~0.5 µm (>2h) | *~10 nm - ~0.5 µm (>2h) | ||
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* 0 nm - 100 nm | * 0 nm - 100 nm | ||
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*3-5 nm/min (RF sputtering) | *3-5 nm/min (RF sputtering) | ||
*0.3 - 0.5 nm/min | *0.3 - 0.5 nm/min | ||
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* 0.06 nm/min - 0.40 nm/min (very recipe and temperature dependent) | * 0.06 nm/min - 0.40 nm/min (very recipe and temperature dependent) | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!Step coverage | !Step coverage | ||
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*Not Known | *Not Known | ||
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*Done at RT. There is a possibility to run at higher temperatures | *Done at RT. There is a possibility to run at higher temperatures | ||
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*120<sup>o</sup>C - 150<sup>o</sup>C: Amorphous TiO<sub>2</sub> | *120<sup>o</sup>C - 150<sup>o</sup>C: Amorphous TiO<sub>2</sub> | ||
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*[[/IBSD of TiO2|TiO2 made on IBE/IBSD Ionfab300]] | *[[/IBSD of TiO2|TiO2 made on IBE/IBSD Ionfab300]] | ||
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* | * | ||
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*1x 100 mm wafers | *1x 100 mm wafers | ||
*1x 150 mm wafers | *1x 150 mm wafers | ||
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ALD1: | ALD1: | ||
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*Pb and poisonous materials only after special agreement | *Pb and poisonous materials only after special agreement | ||
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*Silicon | *Silicon | ||
*Silicon oxide, silicon nitride | *Silicon oxide, silicon nitride |
Revision as of 15:28, 27 March 2020
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Deposition of Titanium Oxide
Titanium oxide can be deposited either by a sputter technique or by use of ALD (atomic layer deposition). At the moment the only system where we have a target for Titanium oxide is IBE/IBSD Ionfab300. The target is Ti. During the sputter deposition oxygen is added to the chamber resulting in Titanium oxide on the sample.
Comparison of the methods for deposition of Titanium Oxide
Sputter technique using IBE/IBSD Ionfab300 | Sputter System Lesker | ALD Picosun 200 | |
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Generel description |
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Stoichiometry |
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Film Thickness |
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Deposition rate |
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Step coverage |
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Process Temperature |
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More info on TiO2 |
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ALD1: ALD2: | |
Substrate size |
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ALD1:
ALD2:
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Allowed materials |
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