Specific Process Knowledge/Thin film deposition/Deposition of Titanium Oxide: Difference between revisions

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==Deposition of Titanium Oxide==
==Deposition of Titanium Oxide==
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!Sputter technique using [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab300]]
!Sputter technique using [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab300]]
![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]]
![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]]
![[Specific Process Knowledge/Thin film deposition/III-V Dielectric evaporator|III-V Dielectric evaporator]]
![[Specific Process Knowledge/Thin film deposition/ALD Picosun R200|ALD Picosun 200]]
![[Specific Process Knowledge/Thin film deposition/ALD Picosun R200|ALD Picosun 200]]
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|-
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*Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma.
*Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma.
*RF sputtering of TiO2 target
*RF sputtering of TiO2 target
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* E-beam evaporation of TiO2
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*ALD (atomic layer deposition) of TiO<sub>2</sub>
*ALD (atomic layer deposition) of TiO<sub>2</sub>
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*Can probably be varied (sputter target: Ti, O2 added during deposition)
*Can probably be varied (sputter target: Ti, O2 added during deposition)
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*unknown
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*unknown
*unknown
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*~10 nm - ~0.5 µm (>2h)
*~10 nm - ~0.5 µm (>2h)
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*~10 nm - ~200 nm
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* 0 nm - 100 nm
* 0 nm - 100 nm
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*3-5 nm/min (RF sputtering)
*3-5 nm/min (RF sputtering)
*0.3 - 0.5 nm/min
*0.3 - 0.5 nm/min
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* 1 - 2 Å/s
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* 0.06 nm/min - 0.40 nm/min (very recipe and temperature dependent)
* 0.06 nm/min - 0.40 nm/min (very recipe and temperature dependent)
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|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!Step coverage
!Step coverage
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*Not Known
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*Not Known
*Not Known
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*Done at RT. There is a possibility to run at higher temperatures
*Done at RT. There is a possibility to run at higher temperatures
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*Sample temperature can be set to 20-250 <sup>o</sup>C
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*120<sup>o</sup>C - 150<sup>o</sup>C: Amorphous TiO<sub>2</sub>
*120<sup>o</sup>C - 150<sup>o</sup>C: Amorphous TiO<sub>2</sub>
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*[[/IBSD of TiO2|TiO2 made on IBE/IBSD Ionfab300]]
*[[/IBSD of TiO2|TiO2 made on IBE/IBSD Ionfab300]]
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*
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*
*
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*1x 100 mm wafers
*1x 100 mm wafers
*1x 150 mm wafers  
*1x 150 mm wafers  
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*1x 2" wafer or
*several smaller samples
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ALD1:
ALD1:
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*Pb and poisonous materials only after special agreement
*Pb and poisonous materials only after special agreement
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*Silicon
*Silicon
*Silicon oxide, silicon nitride
*Silicon oxide, silicon nitride

Revision as of 15:28, 27 March 2020

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Deposition of Titanium Oxide

Titanium oxide can be deposited either by a sputter technique or by use of ALD (atomic layer deposition). At the moment the only system where we have a target for Titanium oxide is IBE/IBSD Ionfab300. The target is Ti. During the sputter deposition oxygen is added to the chamber resulting in Titanium oxide on the sample.

Comparison of the methods for deposition of Titanium Oxide

Sputter technique using IBE/IBSD Ionfab300 Sputter System Lesker ALD Picosun 200
Generel description
  • TiO2 created from a Ti sputter target. By adding oxygen during the deposition TiO2 is created.
  • Reactive DC sputtering of Ti target in Ar/O2 (10% O2) plasma.
  • RF sputtering of TiO2 target
  • ALD (atomic layer deposition) of TiO2
Stoichiometry
  • Can probably be varied (sputter target: Ti, O2 added during deposition)
  • unknown
  • Temperature dependent - Anatase or amorphous TiO2
Film Thickness
  • ~10 nm - ~0.5 µm (>2h)
  • ~10 nm - ~0.5 µm (>2h)
  • 0 nm - 100 nm
Deposition rate
  • 3.0-3.5 nm/min (reactive sputtering)
  • 3-5 nm/min (RF sputtering)
  • 0.3 - 0.5 nm/min
  • 0.06 nm/min - 0.40 nm/min (very recipe and temperature dependent)
Step coverage
  • Not Known
  • Not Known
  • Very good. Covers sample everywhere (but long purge time needed for very high aspect ratio structures)
Process Temperature
  • Expected to be below 100oC
  • Done at RT. There is a possibility to run at higher temperatures
  • 120oC - 150oC: Amorphous TiO2
  • 300oC - 350oC: Anatase TiO2
More info on TiO2

ALD1:

ALD2:

Substrate size
  • 1 50mm wafer
  • 1 100mm wafer
  • 1 150mm wafer
  • 1 200mm wafer
  • Smaller pieces can be mounted with capton tape
  • several small samples
  • several 50 mm wafers (Ø150mm carrier)
  • 1x 100 mm wafers
  • 1x 150 mm wafers

ALD1:

  • 1-5 100 mm wafers
  • 1-5 150 mm wafers
  • 1 200 mm wafer
  • Several smaller samples

ALD2:

  • 1 100 mm wafer
  • 1 150 mm wafer
  • 1 200 mm wafer
  • Several smaller samples
Allowed materials
  • Almost any materials
  • not Pb and very poisonous materials
  • Almost any materials
  • Pb and poisonous materials only after special agreement
  • Silicon
  • Silicon oxide, silicon nitride
  • Quartz/fused silica
  • Metals - Use a dedicated carrier wafer
  • III-V materials - Use dedicated carrier wafer
  • Polymers - Depending on the melting point/deposition temperature, use dedicated carrier wafer. Ask for permission