Specific Process Knowledge/Characterization/XRD/XRD Powder: Difference between revisions
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=The XRD Powder setup= | =The XRD Powder setup= | ||
The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders | The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders. It is located in the basement of building 346 at Nanolab, Room 904. | ||
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[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=463 XRD Powder in LabManager] | [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=463 XRD Powder in LabManager] | ||
==Equipment performance and process related parameters== | |||
{| border="2" cellspacing="0" cellpadding="2" | |||
!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | |||
|style="background:WhiteSmoke; color:black"|<b>XRD SmartLab</b> | |||
|style="background:WhiteSmoke; color:black"|<b>XRD Powder</b> | |||
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!style="background:silver; color:black;" align="center" width="60"|Purpose | |||
|style="background:LightGrey; color:black"| Crystal structure analysis and thin film thickness measurement | |||
|style="background:WhiteSmoke; color:black"| | |||
*Phase ID | |||
*Crystal Size | |||
*Crystallinity | |||
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!style="background:silver; color:black" align="center" valign="center" rowspan="6"|X-ray generator | |||
|style="background:LightGrey; color:black"| | |||
Maximum rated output | |||
|style="background:WhiteSmoke; color:black"| | |||
600 W | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Rated tube voltage | |||
|style="background:WhiteSmoke; color:black"| | |||
40 kV | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Rated tube current | |||
|style="background:WhiteSmoke; color:black"| | |||
15 mA | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Type | |||
|style="background:WhiteSmoke; color:black"| | |||
Sealed tube | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Target | |||
|style="background:WhiteSmoke; color:black"| | |||
Cu | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Focus size | |||
|style="background:WhiteSmoke; color:black"| | |||
0.4 mm x 12 mm (Line) | |||
|- | |||
!style="background:silver; color:black" align="center" valign="center" rowspan="5"|Goniometer | |||
|style="background:LightGrey; color:black"| | |||
Scanning mode | |||
|style="background:WhiteSmoke; color:black"| | |||
incident / receiver coupled | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Goniomenter radius | |||
|style="background:WhiteSmoke; color:black"| | |||
145 mm | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Minimum step size | |||
|style="background:WhiteSmoke; color:black"| | |||
0.001° (3.6") | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Sample stage | |||
|style="background:WhiteSmoke; color:black"| | |||
Fixed with rotation | |||
|- | |||
|style="background:LightGrey; color:black"| | |||
Sample size | |||
|style="background:WhiteSmoke; color:black"| | |||
Powders | |||
|- | |||
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics | |||
|style="background:LightGrey; color:black"|Incident side | |||
|style="background:WhiteSmoke; color:black"| | |||
*0.04° soller slit | |||
*Ni and Cu filter | |||
*Divergence slits | |||
*Beam mask | |||
|- | |||
|style="background:LightGrey; color:black"|Receiver side | |||
|style="background:WhiteSmoke; color:black"| | |||
*0.04° soller slit | |||
*Ni filter | |||
|- | |||
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | |||
|style="background:LightGrey; color:black"|Substrate size | |||
|style="background:WhiteSmoke; color:black"| | |||
Only for powders | |||
|- | |||
| style="background:LightGrey; color:black"|Allowed materials | |||
|style="background:WhiteSmoke; color:black"| | |||
All materials have to be approved | |||
|- | |||
|} | |||
<br clear="all" /> | |||