Revision as of 16:16, 23 March 2020

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The XRD Powder setup

The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders. It is located in the basement of building 346 at Nanolab, Room 904.

The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:

XRD Powder in LabManager

Equipment performance and process related parameters

Equipment		XRD SmartLab	XRD Powder
Purpose	Crystal structure analysis and thin film thickness measurement	Phase ID Crystal Size Crystallinity
X-ray generator	Maximum rated output	600 W
	Rated tube voltage	40 kV
	Rated tube current	15 mA
	Type	Sealed tube
	Target	Cu
	Focus size	0.4 mm x 12 mm (Line)
Goniometer	Scanning mode	incident / receiver coupled
	Goniomenter radius	145 mm
	Minimum step size	0.001° (3.6")
	Sample stage	Fixed with rotation
	Sample size	Powders
Optics	Incident side	0.04° soller slit Ni and Cu filter Divergence slits Beam mask
Optics	Receiver side	0.04° soller slit Ni filter
Substrates	Substrate size	Only for powders
	Allowed materials	All materials have to be approved

@@ Line 3: / Line 3: @@
 =The XRD Powder setup=
-The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders and bulk materials. It is located in the basement of building 346 at Nanolab, Room 904.
+The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders. It is located in the basement of building 346 at Nanolab, Room 904.
@@ Line 9: / Line 9: @@
 [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=463 XRD Powder in LabManager]
+==Equipment performance and process related parameters==
+{| border="2" cellspacing="0" cellpadding="2"
+!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment
+|style="background:WhiteSmoke; color:black"|<b>XRD SmartLab</b>
+|style="background:WhiteSmoke; color:black"|<b>XRD Powder</b>
+|-
+!style="background:silver; color:black;" align="center" width="60"|Purpose
+|style="background:LightGrey; color:black"| Crystal structure analysis and thin film thickness measurement
+|style="background:WhiteSmoke; color:black"|
+*Phase ID
+*Crystal Size
+*Crystallinity
+|-
+!style="background:silver; color:black" align="center" valign="center" rowspan="6"|X-ray generator
+|style="background:LightGrey; color:black"|
+Maximum rated output
+|style="background:WhiteSmoke; color:black"|
+W
+|-
+|style="background:LightGrey; color:black"|
+Rated tube voltage
+|style="background:WhiteSmoke; color:black"|
+kV
+|-
+|style="background:LightGrey; color:black"|
+Rated tube current
+|style="background:WhiteSmoke; color:black"|
+mA
+|-
+|style="background:LightGrey; color:black"|
+Type
+|style="background:WhiteSmoke; color:black"|
+Sealed tube
+|-
+|style="background:LightGrey; color:black"|
+Target
+|style="background:WhiteSmoke; color:black"|
+Cu
+|-
+|style="background:LightGrey; color:black"|
+Focus size
+|style="background:WhiteSmoke; color:black"|
+.4 mm x 12 mm (Line)
+|-
+!style="background:silver; color:black" align="center" valign="center" rowspan="5"|Goniometer
+|style="background:LightGrey; color:black"|
+Scanning mode
+|style="background:WhiteSmoke; color:black"|
+incident / receiver coupled
+|-
+|style="background:LightGrey; color:black"|
+Goniomenter radius
+|style="background:WhiteSmoke; color:black"|
+mm
+|-
+|style="background:LightGrey; color:black"|
+Minimum step size
+|style="background:WhiteSmoke; color:black"|
+.001° (3.6")
+|-
+|style="background:LightGrey; color:black"|
+Sample stage
+|style="background:WhiteSmoke; color:black"|
+Fixed with rotation
+|-
+|style="background:LightGrey; color:black"|
+Sample size
+|style="background:WhiteSmoke; color:black"|
+Powders
+|-
+!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics
+|style="background:LightGrey; color:black"|Incident side
+|style="background:WhiteSmoke; color:black"|
+*0.04° soller slit
+*Ni and Cu filter
+*Divergence slits
+*Beam mask
+|-
+|style="background:LightGrey; color:black"|Receiver side
+|style="background:WhiteSmoke; color:black"|
+*0.04° soller slit
+*Ni filter
+|-
+!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
+|style="background:LightGrey; color:black"|Substrate size
+|style="background:WhiteSmoke; color:black"|
+Only for powders
+|-
+| style="background:LightGrey; color:black"|Allowed materials
+|style="background:WhiteSmoke; color:black"|
+All materials have to be approved
+|-
+|}
+<br clear="all" />