Specific Process Knowledge/Thermal Process/A1 Bor Drive-in furnace: Difference between revisions
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==Overview of the performance of the Boron Drive-in | ==Overview of the performance of the Boron Drive-in and Pre-dep furnace and some process related parameters== | ||
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!style="background:silver; color:black;" align="center"|Purpose | !style="background:silver; color:black;" align="center"|Purpose | ||
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* | *Thermal oxidation of Si wafers | ||
* | *Boron pre-deposition/doping of Si wafers | ||
*Oxidation of boron phase layers | *Oxidation of boron phase layers | ||
* | *Driving-in pre-deposited or ion-implanted boron | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
Thermal oxidation: | |||
*Dry oxidation using O<sub>2</sub> | *Dry oxidation using O<sub>2</sub> | ||
*Wet oxidation using H<sub>2</sub>O generated by a torch | *Wet oxidation using H<sub>2</sub>O vapour generated by a torch | ||
Boron pre-deposition/doping: | |||
*Boron-nitride wafers are used as doping source. This is a solid doping source containing B<sub>2</sub>O<sub>3</sub> | |||
Driving-in pre-deposited or ion-implanted boron | |||
*Dry or wet oxidation recipes are normally used for this purpose | |||
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!style="background:silver; color:black" align="center"|Performance | !style="background:silver; color:black" align="center"|Performance | ||
|style="background:LightGrey; color:black"|Film thickness||style="background:WhiteSmoke; color:black"| | |style="background:LightGrey; color:black"|Film thickness||style="background:WhiteSmoke; color:black"| | ||
*Dry oxide: | *Dry oxide: ~ 0 nm - 300 nm (it takes too long to grow a thicker oxide) | ||
*Wet oxide: | *Wet oxide: ~ 0 nm to 3 µm (23 hours wet oxidation at 1100 <sup>o</sup>C) | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range | ||
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|style="background:LightGrey; color:black"|Process pressure | |style="background:LightGrey; color:black"|Process pressure | ||
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*1 atm | *1 atm (no vacuum) | ||
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|style="background:LightGrey; color:black"|Gasses on the system | |style="background:LightGrey; color:black"|Gasses on the system | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*N<sub>2</sub> | |||
*O<sub>2</sub>, | *O<sub>2</sub> | ||
*H<sub>2</sub> (in a torch, H<sub>2</sub> and O<sub>2</sub> burns into water vapour for wet oxidation) | |||
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | ||
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*Silicon wafers (RCA cleaned) | *Silicon wafers (RCA cleaned) | ||
*Boron-nitride source wafers for boron pre-deposition/doping | |||
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Revision as of 12:17, 18 March 2020
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Boron Drive-in + Pre-dep furnace (A1)
The Boron Drive-in + Pre-dep furnace (A1) is a Tempress horizontal furnace for thermal oxidation of silicon wafers. Also boron pre-deposition/doping is done furnace. Furthermore, the furnace is used for boron drive-in after the pre-deposition or after boron ion implantation.
The furnace is mostly used for wet and dry thermal oxidation of silicon wafers. The oxidation recipes are named e.g. "WET1000" and "DRY1000", where "WET" or "DRY" indicates whether it is a wet or dry oxidation process, and the number indicates the oxidation temperature.
The purpose of the boron doping is to make conductive structures, etch stop layers etc. For pre-deposition of silicon wafers, boron-nitride source wafers are used as doping source. There are only a few source wafers available, i.e. it is not possible to dope an entire batch of 30 wafers, but both sides of the source wafers are available for doping. It is necessary to activate the source wafers before use by heating them for 1 hour at the temperature needed during the pre-deposition (but never at a temperatures lower than 1050 C). During the pre-deposition a boron phase layer is created on the silicon wafers. This layer can be removed in BHF, if argon is used instead of nitrogen for the pre-deposition (at temperatures higher then 1050 C), otherwise the wafers have to be oxidized before the BHF etch. When the boron phase layer has been removed, the wafers can go directly into the furnace again for a drive-in process with or without an oxide growth.
The Boron Drive-in and Pre-dep furnace is the top furnace tube in the furnace A-stack positioned in cleanroom B-1. The furnaces in the A-stack are the cleanest of all furnaces in the cleanroom. Please be aware of that all wafers have to be RCA cleaned before they enter the furnace, and please check the cross contamination information in LabManager, before you use the furnace. Before boron pre-deposition, also the source wafers and a dedicated carbide boat have to be RCA cleaned.
The user manual, quality control instruction and results, technical information and contact information can be found in LabManager:
Boron Drive-in and Pre-dep furnace (A1)
Process knowledge
- Oxidation: look at the Oxidation page
- Boron drive-in: look at the Dope with Boron page
- Boron doping: look at the Dope with Boron page.
Quality Control - Parameters and Limits
Quality control (QC) for the processes "Wet1050" and "Dry1050" | ||||||||||||||||||||||||||
Numbers from March 2020 |
Purpose |
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Thermal oxidation:
Boron pre-deposition/doping:
Driving-in pre-deposited or ion-implanted boron
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Performance | Film thickness |
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Process parameter range | Process Temperature |
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Process pressure |
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Gasses on the system |
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Substrates | Batch size |
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Substrate materials allowed |
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