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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
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!Steep/abrupt steps but no high aspect ratio
!Steep/abrupt steps but no high aspect ratio
!High aspect ratio measurements
!High aspect ratio measurements
!Large area fast scan
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|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' or '''ScanAsyst mode" .  
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' or '''ScanAsyst mode" .  
|For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefore we recommend '''Tapping mode'''.
|For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefore we recommend '''Tapping mode'''.
|For large scan areas where you prioritize to scan fast then you can use '''contact mode'''. Here you can scan with scan rate of up to 2.43 Hz
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|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or
|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]'''
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]'''
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