Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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==Accessories following the systems == | ==Accessories following the systems == | ||
{| border="2" cellspacing="0" cellpadding="2" | {| border="2" cellspacing="0" cellpadding="2" valign="top" | ||
!border="none" style="background:silver; color:black;" align="center"|Equipment | !border="none" style="background:silver; color:black;" align="center"|Equipment | ||
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*Microscope Image Registration and Overlay (MIRO) software. '''this is only working in the old software (before version 9.4)''' | *Microscope Image Registration and Overlay (MIRO) software. '''this is only working in the old software (before version 9.4)''' | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black" valign="top"| | ||
*ScanAsyst | *ScanAsyst | ||
*TappingMode (air) | *TappingMode (air) | ||
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|} | |} | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black" valign="top"| | ||
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" | {|border="1" cellspacing="1" cellpadding="3" style="text-align:left;" | ||
|- | |- | ||
|-style="background:silver; color:black" | |-style="background:silver; color:black" | ||