Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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*QC grid: VGRP-15M 10µm pitch and depth reference 178nm | *QC grid: VGRP-15M 10µm pitch and depth reference 178nm | ||
*PF KPFM-SMPL Kelvin probe Sample: Al + Au on Si | *PF KPFM-SMPL Kelvin probe Sample: Al + Au on Si | ||
*HOPG: Highly Oriented Pyrolytic Graphite | |||
'''Calibration samples for getting quantitative modulus measurements:''' | '''Calibration samples for getting quantitative modulus measurements:''' | ||
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#HOPG-12M: Highly Orientated Pyrolytic Graphite | #HOPG-12M: Highly Orientated Pyrolytic Graphite | ||
#PS-LDPE: Harmonix training | #PS-LDPE: Harmonix training | ||
|style="background:WhiteSmoke; color:black"| | |||
*QC grid: VGRP-15M 10µm pitch and depth reference 181nm | |||
*HOPG: Highly Oriented Pyrolytic Graphite | *HOPG: Highly Oriented Pyrolytic Graphite | ||
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