LabAdviser/314/Microscopy 314-307/SEM/Nova/Transmission Kikuchi diffraction: Difference between revisions

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 = On-axis Transmission Kikuchi diffraction =
-This technique is based on the collection of Kikuchi patterns from electron transparent samples. For TKD an electron transparent sample is required, resulting in an intensive sample preparation. This also results in both a smaller region being available for analysis and additional stress release considerations, as there are two free surfaces rather than one. Furthermore the acquisition of TKD patterns from relatively thick samples can be done (as soon as they are electron transparent at that thickness), but the effects of beam broadening due to electron scattering inside the sample become stronger in increasingly thick specimens and lead to degradation of the lateral spatial resolution.
+This technique is based on the collection of Kikuchi patterns from electron transparent samples. In 2016 the on-axis TKD configuration was presented. In this system the detector is located perpendicularly beneath the electron transparent sample on the optical axis of
-In 2016 the on-axis TKD configuration was presented. In this system the detector is located perpendicularly beneath the electron transparent sample on the optical axis of
 the microscope, obtaining an instrument resolution almost the same as that using Kikuchi patterns in TEM. A schematic illustration of the detector is shown in Fig. 6.