LabAdviser/314/Microscopy 314-307/SEM/Nova/Transmission Kikuchi diffraction: Difference between revisions
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the on-axis detector con�guration, which has already become the standard | the on-axis detector con�guration, which has already become the standard | ||
geometry for TKD measurements. | geometry for TKD measurements. | ||
= In-situ heating TKD analysis of ultra-thin metal fi�lms = | |||