LabAdviser/314/Microscopy 314-307/SEM/Nova/Transmission Kikuchi diffraction: Difference between revisions
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<gallery widths="350px" heights="350px" perrow="2" halign="center"> image:Picture11.png|Fig. 1: Schematic representation of Kikuchi lines formation. | <gallery widths="350px" heights="350px" perrow="2" halign="center"> image:Picture11.png|Fig. 1: Schematic representation of Kikuchi lines formation. | ||
image:Picture4.png|Fig. 2: Image of a Kikuchi pattern from an Au thin-film, recorded on a FEI Nova 600 NanoSEM at 30 kV acceleration voltage. </gallery> | image:Picture4.png|Fig. 2: Image of a Kikuchi pattern from an Au thin-film, recorded on a FEI Nova 600 NanoSEM at 30 kV acceleration voltage. </gallery> | ||
The simple geometry of Kikuchi diffraction makes indexing and orientation determination from Kikuchi patterns straightforward: the position of the diffracting lattice plane in the crystal can be easily determined from the center line of a pair of Kikuchi lines, together with the lattice plane spacing from the distance between the lines themselves. | |||
= Indexing of Kikuchi patterns = | = Indexing of Kikuchi patterns = | ||