Specific Process Knowledge/Etch/DRIE-Pegasus: Difference between revisions
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!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | !colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment | ||
|style="background:silver; color:black" width=" | |style="background:silver; color:black" width="250" |[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-1| '''DRIE-Pegasus 1''']] | ||
|style="background:silver; color:black"|[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-2| '''DRIE-Pegasus 2''']] | |style="background:silver; color:black" width="250" |[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-2| '''DRIE-Pegasus 2''']] | ||
|style="background:silver; color:black"|[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-3| '''DRIE-Pegasus 3''']] | |style="background:silver; color:black" width="250" |[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-3| '''DRIE-Pegasus 3''']] | ||
|style="background:silver; color:black"|[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4| '''DRIE-Pegasus 4''']] | |style="background:silver; color:black" width="250" |[[Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4| '''DRIE-Pegasus 4''']] | ||
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!style="background:silver; color:black;" align="center" valign="center" width="80" rowspan="2"|Purpose | !style="background:silver; color:black;" align="center" valign="center" width="80" rowspan="2"|Purpose | ||
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|style="background:LightGrey; color:black"|Process options | |style="background:LightGrey; color:black"|Process options | ||
|style="background:lightgrey; color:black"| | |style="background:lightgrey; color:black"| | ||
* Bosch processes with etch and dep cycles | * Bosch processes with etch and dep cycles each split into three | ||
* Parameter ramping during process steps | * Parameter ramping during process steps | ||
* SOI option to reduce notching at buried | * SOI option to reduce notching at buried | ||
* Picoscope monitoring | |||
* Claritas endpoint detection system | |||
|style="background:lightgrey; color:black"| | |||
* Bosch processes with etch and dep cycles each split into three | |||
* Parameter ramping during process steps | |||
* SOI option to reduce notching at buried | |||
* Picoscope monitoring | |||
* Verity OES | |||
|style="background:lightgrey; color:black"| | |||
* Bosch processes with etch and dep cycles each split into three | |||
* Parameter ramping during process steps | |||
|style="background:lightgrey; color:black"| | |||
* Bosch processes with etch and dep cycles each split into three | |||
* Parameter ramping during process steps | |||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | ||
|style="background:whitesmoke; color:black"|Batch size | |style="background:whitesmoke; color:black"|Batch size | ||