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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
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|Box1 no. 6||abshir||Bad force curve (fluctuates)||[[File:Box1 no6 tilt0_34.jpg|200px]][[File:Box1 no6 tilt0_35.jpg|200px]]
|Box1 no. 6||abshir||Bad force curve (fluctuates)||[[File:Box1 no6 tilt0_34.jpg|200px]][[File:Box1 no6 tilt0_35.jpg|200px]]
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|Box1 no. 7||bghe||Was OK on large structures but they got larger
|Box1 no. 7||bghe||Was OK on large structures but they got larger||[[File:Box1 no7 tilt0_32.jpg|200px]][[File:Box1 no7 tilt0_33.jpg|200px]]
|-
|-
|Box1 no. 8||mattod||Bad force curve
|Box1 no. 8||mattod||Bad force curve
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