Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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|Box1 no. 5||mattod||Tip broken during tip change||[[File:Box1 no5 tilt21_20.jpg|200px]] | |Box1 no. 5||mattod||Tip broken during tip change||[[File:Box1 no5 tilt21_20.jpg|200px]] | ||
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|Box1 no. 6||abshir||Bad force curve (fluctuates) | |Box1 no. 6||abshir||Bad force curve (fluctuates)||[[File:Box1 no6 tilt0_34.jpg|200px]][[File:Box1 no6 tilt0_35.jpg|200px]] | ||
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|Box1 no. 7||bghe||Was OK on large structures but they got larger | |Box1 no. 7||bghe||Was OK on large structures but they got larger | ||