Specific Process Knowledge/Lithography/Coaters: Difference between revisions
Appearance
| Line 238: | Line 238: | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,446 | ||
| | |5,5% | ||
| | |17/02 2015 | ||
|chasil | |chasil | ||
|with HMDS. Average of | |with HMDS. Average of 3 wafers | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,415 | ||
| | |3,7% | ||
| | |1/4 2015 | ||
|chasil | |chasil | ||
|with HMDS. Average of 3 wafers | |with HMDS. Average of 3 wafers | ||