Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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====System noise==== | ====System noise==== | ||
Noise on sample: scan size 0.1nm | Noise on sample: scan size 0.1nm <br> | ||
we started with 1my scan size to optimize the scan. | we started with 1my scan size to optimize the scan. <br> | ||
2.43Hz | 2.43Hz <br> | ||
256 lines | 256 lines <br> | ||
Z range at 2my to get sub nanometer resolution in Z | Z range at 2my to get sub nanometer resolution in Z <br> | ||
Rq: 54,5pm (plade vibrator koerte udenfor) | Rq: 54,5pm (plade vibrator koerte udenfor) <br> | ||
Rq: 23pm uden vibrator koerende + ro og med aaben hood. | Rq: 23pm uden vibrator koerende + ro og med aaben hood. <br> | ||
Rq:71pm uden vibrator koerende + ro og med lukket hood | Rq:71pm uden vibrator koerende + ro og med lukket hood <br> | ||
[[File:SystemNoise.jpg|thumb|left|400px]][[File:systemNoise_open_closed_hood.jpg|thumb|left|400px]] | |||
===Roughness=== | ===Roughness=== | ||