Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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===Graphene KPFM measurement=== | ===Graphene KPFM measurement=== | ||
[[File:AFM Icon KPFM1.jpg|800px]][[File:AFM Icon KPFM2.jpg|440px]] | [[File:AFM Icon KPFM1.jpg|800px]][[File:AFM Icon KPFM2.jpg|440px]]<br> | ||
Height image: The graphene and structuring in graphene is not visible <br> | |||
Potential image: Potential difference between grapheme and non-graphene is visible <br> | |||
Phase: Phase imaging maps the phase lag between the periodic signal driving the cantilever and the oscillations of the cantilever. Changes in phase lag often indicate changes in the properties of the sample surface. Here the structuring in the graphene is very clear | |||