Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
| Line 128: | Line 128: | ||
===HAR: 2µm wide 6µm deep=== | ===HAR: 2µm wide 6µm deep=== | ||
===Graphene=== | ===Graphene KPFM measurement=== | ||
[[File:AFM Icon KPFM1.jpg|400px]][[File:AFM Icon KPFM2.jpg|220px]] | |||