Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

@@ Line 50: / Line 50: @@
 Probes that followed the system (we may not have them anymore!)
-'''For PF KPFM:'''
+{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;"
+|-
-*SCM-PIT 10ps
+|-
-*PFQNE-Al 10ps
+|-style="background:silver; color:black"
+!
+!ScanAsyst mode
+!Tapping mode
+!Contact mode
+!PF-KPFM
+|-
+|-
+|-style="background:WhiteSmoke; color:black"
+!Generel description
+|Generel description - method 1
+|Generel description - method 2
+|
+|
+|-
+|-
+|-style="background:LightGrey; color:black"
-'''Contact mode:'''
+!Probes that followed the system
+|
-*SNL-10 20ps
+*ScanAsyst air 30ps
+*ScanAsyst fluid 10ps
+*ScanAsyst fluid + 10ps
-'''Tapping mode:'''
+|
 *MPP-11100-10
 *MPP-21100-10
@@ Line 71: / Line 85: @@
 *OTESPA-R3 10ps
 *High Aspect ratio probes 1:15: FIB6-400A 5ps
-'''ScanAsyst:'''
-*ScanAsyst air 30ps
-*ScanAsyst fluid 10ps
-*ScanAsyst fluid + 10ps
-'''PeakForce QNM:'''
 *MPP-12120 10ps.  Tap150A
 *MPP-13120-10 TAP525A
+|
+*SNL-10 20ps
+|
+*SCM-PIT 10ps
+*PFQNE-Al 10ps
+|-
+|}
+<br clear="all" />
 ===Samples===