Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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==Acceptance tests done== | ==Acceptance tests done== | ||
===Noise test=== | |||
===HAR: 100nm wide 400nm deep=== | |||
===HAR: 2µm wide 6µm deep=== | |||
===Graphene=== | |||