Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
| Line 31: | Line 31: | ||
|'''ScanAsyst in air''' for ScanAsyst mode | |'''ScanAsyst in air''' for ScanAsyst mode | ||
'''TAP300Al-G''' for Tapping mode | '''TAP300Al-G''' for Tapping mode | ||
|'''AR5T-NCH''' | |'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR.html AR5T-NCH]''' | ||
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | '''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | ||
|- | |- | ||
Revision as of 14:53, 22 October 2014
Feedback to this page: click here
What scanning mode, experiment/workspace and probe should I select
| Roughness measurements | Topographic measurements with no steep/abrupt steps | Steep/abrupt steps but no high aspect ratio | High aspect ratio measurements | |
|---|---|---|---|---|
| Recommended mode | Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend ScanAsyst mode because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | For Topographic measurements with no steep/abrupt steps we also recommend ScanAsyst mode due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | For Steep/abrupt steps but no high aspect ratio structures we still recommend ScanAsyst mode due to ease of use but it will scan slower than Tapping mode. | For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefor we recommend Tapping mode. |
| Recommended probes | ScanAsyst in air | ScanAsyst in air | ScanAsyst in air for ScanAsyst mode
TAP300Al-G for Tapping mode |
AR5T-NCH |
| Recommended experiment/Workspace |
ScanAsyst in air - roughness (<10nm) |
ScanAsyst in air - standards |
ScanAsyst in air - steep steps | Tapping mode in air 300nm (for steps <~1µm)
Tappping mode in air 6µm (for steps >1~µm) |