Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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*Microscope Image Registration and Overlay (MIRO) software | *Microscope Image Registration and Overlay (MIRO) software | ||
===Probes | ===Probes=== | ||
Probes that followed the system (we may not have them anymore!) | Probes that followed the system (we may not have them anymore!) | ||
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*MPP-12120 10ps. Tap150A | *MPP-12120 10ps. Tap150A | ||
*MPP-13120-10 TAP525A | *MPP-13120-10 TAP525A | ||
===Samples: === | ===Samples: === | ||