Jump to content

Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide/Deposition of Silicon Oxide using PECVD: Difference between revisions

From LabAdviser
BGE (talk | contribs)
No edit summary
Line 10: Line 10:
|N<math>_2</math>O flow [sccm]
|N<math>_2</math>O flow [sccm]
|N2 flow [sccm]
|N2 flow [sccm]
|B2H6 flow [sccm]
|PH3 flow [sccm]
|Pressure [mTorr]
|Pressure [mTorr]
|Power [W]
|Power [W]
|Description
|Description
|-  
|-  
|1oxide
|1oxide/standard
|17
|17
|1600
|1600
|0
|0
|0
|0
|400
|400
|380LF
|380LF
|Developed for waveguides
|Developed for waveguides
|-
|1PBSG
|
|
|
|
|
|
|
|Developed for waveguide top cladding
|-
|-
|}
|}

Revision as of 11:25, 20 December 2007

At the moment DANCHIP has 3 PECVDs that can deposite silicon oxide with or without dopants of Boron, Phosphorous or Germanium. PECVD1 and PECVD3 are for silicon based processing. PECVD2 is for III-V processing and will be describes under III-V processing. Look at the PECVD page to learn more about the PECVDs at DANCHIP. All though PECVD1 and PECVD3 are very much alike you cannot count on the a recipe on one system will give exactly the same results on the other system.


Recipes on PECVD1 for deposition of silicon oxides

Recipes

Recipe name SiH4 flow [sccm] N2O flow [sccm] N2 flow [sccm] B2H6 flow [sccm] PH3 flow [sccm] Pressure [mTorr] Power [W] Description
1oxide/standard 17 1600 0 0 0 400 380LF Developed for waveguides
1PBSG Developed for waveguide top cladding

Expected results

Recipe name Deposition rate [nm/min] RI Uniformity [%]
1oxide ~193 1.46 2


Recipes on PECVD3 for deposition of silicon oxides

Recipes

Recipe name SiH4 flow [sccm] N2O flow [sccm] N2 flow [sccm] Pressure [mTorr] Power [W] Description
LFSiO 12 1420 392 550 60

LF=Low Frequency

Expected results

Recipe name Deposition rate [nm/min] RI Uniformity [%]
LFSiO ~81 ~1.48 <1