Specific Process Knowledge/Thin film deposition/Deposition of Chromium/Thermal evaporation of Cr in Thermal evaporator: Difference between revisions

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	[[image:eves_20210126_Cr_thermal_evaporator_09.png\|center\|300x300px\|thumb\|Figure 8. Thickness distribution across 6" wafer. Measurement is performed using [[Specific_Process_Knowledge/Characterization/~~Profiler#Dektak_XTA_stylus_profiler~~\|Dektak profilometer]].]]		[[image:eves_20210126_Cr_thermal_evaporator_09.png\|center\|300x300px\|thumb\|Figure 8. Thickness distribution across 6" wafer. Measurement is performed using [[Specific_Process_Knowledge/Characterization/Dektak_XTA\|Dektak stylus profilometer]].]]

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