Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide/Deposition of Silicon Oxide using PECVD: Difference between revisions
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|LFSiO | |LFSiO | ||
|12 | |12 | ||
|1420 (setting | |1420 (setting in software is 710) | ||
|392 | |392 | ||
|550 | |550 | ||
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LF=Low Frequency | LF=Low Frequency | ||
===Expected results=== | ===Expected results=== | ||