Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide/Deposition of Silicon Oxide using PECVD: Difference between revisions
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|LF SiO<!-- Recipe --> | |LF SiO<!-- Recipe --> | ||
| | |75-78 nm/min<!-- Dep. rate [nm/min] --> | ||
| | |1.480-1.483<!-- RI --> | ||
|± 1.7%<!-- Unif. [%] --> | |± 2.1-2.7%<!-- Unif. [%] --> | ||
| | |compressive 309 MPa <!-- Stress [MPa] --> | ||
|<!-- Comments --> | |<!-- Comments --> | ||
| | |12<!-- SiH4 [sccm] --> | ||
| | |<!-- NH3 [sccm] --> | ||
|<!-- N2O [sccm] --> | |1420<!-- N2O [sccm] --> | ||
| | |392<!-- N2 [sccm] --> | ||
| | |550 mTorr<!-- Pressure [mTorr] --> | ||
| | |60LF"<!-- Power [W] --> | ||
|<!-- Load --> | |<!-- Load --> | ||
|<!-- Tune --> | |<!-- Tune --> | ||
| | |1:15/13:00(stress)<!-- Time [mm:ss] --> | ||
|February 2017 bghe<!--Tested --> | |February 2017 bghe<!--Tested --> | ||
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