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LabAdviser/Technology Research/Fabrication of Hyperbolic Metamaterials using Atomic Layer Deposition/EMT Procces flow: Difference between revisions

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Eves (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,346 edits
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|Scanning Electron Microscopy inspection  
|Scanning Electron Microscopy inspection  
|By cleaving the sample it is possible to inspect depositet ALD layers uniformity in cross-sectional mode
|By cleaving the sample it is possible to inspect depositet ALD layers uniformity in cross-sectional mode
|[[Specific_Process_Knowledge/Characterization/SEM_Supra_2|SEM Supra 2]]  
|
[[Specific_Process_Knowledge/Characterization/SEM_Supra_1|SEM Supra 1]]
<br clear="all" />
[[Specific_Process_Knowledge/Characterization/SEM_Supra_2|SEM Supra 2]]
<br clear="all" />
[[Specific_Process_Knowledge/Characterization/SEM_Supra_3|SEM Supra 3]]
|[[image:multilayers222.jpg|250x350px|center]]
|[[image:multilayers222.jpg|250x350px|center]]
|-
|-
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