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LabAdviser/Technology Research/Fabrication of Hyperbolic Metamaterials using Atomic Layer Deposition/EMT Procces flow: Difference between revisions

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Eves (talk | contribs)
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|Scanning Electron Microscopy inspection  
|Scanning Electron Microscopy inspection  
|By cleaving the sample it is possible to inspect depositet ALD layers uniformity in cross-sectional mode
|By cleaving the sample it is possible to inspect depositet ALD layers uniformity in cross-sectional mode
|[[Specific_Process_Knowledge/Characterization/SEM_Supra_2|SEM_Supra_2]] standard development times are listed.
|[[Specific_Process_Knowledge/Characterization/SEM_Supra_2|SEM Supra 2]]  
|[[image:1 Lithography.jpg|250x350px|center]]
|[[image:1 Lithography.jpg|250x350px|center]]
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