Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide/Deposition of Silicon Oxide using PECVD: Difference between revisions
Appearance
| Line 143: | Line 143: | ||
|- | |- | ||
|Non-uniformity | |Non-uniformity | ||
| | |<1.9% | ||
|- | |- | ||
|Refractive index | |Refractive index | ||