Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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-[[image:SEM-Leo.jpg|200x200px|right|thumb|The Leo SEM]]
+{| border="1"
-[[image:SEM-FEI-1.jpg|200x200px|right|thumb|The FEI SEM]]
+|+'''The Scanning Electron Microscopes at Danchip'''
-[[image:SEM-Jeol.jpg|200x200px|right|thumb|The Jeol SEM is located outside the cleanroom in the basement ]]
+|-
+| valign="top"|
+[[File:Drenthe-Position.png|thumb|left|150px|[[w:Drenthe|Drenthe]], the least crowded province]]
+[[File:SEM-Leo.jpg|thumb|200px|The Leo SEM]]
+[[File:SEM-FEI-1.jpg|thumb|200px|right|The Zeiss SEM]]
+|-
+| valign="bottom"|
+[[File:SEM-FEI-1.jpg|thumb|200px|left|The FEI SEM]]
+[[File:SEM-Jeol.jpg|thumb|200px|right|The Jeol SEM is located outside the cleanroom in the basement]]
+|}
 == Scanning electron microscopy at Danchip==