Specific Process Knowledge/Thermal Process/A3 Phosphor Drive-in furnace: Difference between revisions
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==A3 Furnace Phosphor drive-in== | ==A3 Furnace Phosphor drive-in== | ||
[[Image:A3helstak.jpg|thumb|300x300px|A3 | [[Image:A3helstak.jpg|thumb|300x300px|A3 Phosphor drive-in furnace: positioned in cleanroom 2]] | ||
The A3 Furnace Phosphor drive-in is a Tempress horizontal furnace for oxidation of silicon wafers, annealing of the grown oxide and drive-in of phosphorus after a pre-deposition. Phosphorus pre-deposition takes place in the A4 Furnace Phosphor pre-dep. The A3 furnace can also be used for drive-in of phosphorus which has been ion implanted. | The A3 Furnace Phosphor drive-in is a Tempress horizontal furnace for oxidation of silicon wafers, annealing of the grown oxide and drive-in of phosphorus after a pre-deposition. Phosphorus pre-deposition takes place in the A4 Furnace Phosphor pre-dep. The A3 furnace can also be used for drive-in of phosphorus which has been ion implanted. |
Revision as of 09:00, 29 November 2012
A3 Furnace Phosphor drive-in
The A3 Furnace Phosphor drive-in is a Tempress horizontal furnace for oxidation of silicon wafers, annealing of the grown oxide and drive-in of phosphorus after a pre-deposition. Phosphorus pre-deposition takes place in the A4 Furnace Phosphor pre-dep. The A3 furnace can also be used for drive-in of phosphorus which has been ion implanted.
A3 is the third furnace tube in the A-stack positioned in cleanroom 2. The A-stack together with the C2 Furnace Gate oxide are the cleanest of all furnaces in the cleanroom. Please be aware of which substrates are allowed to enter this furnace. Check the cross contamination chart.
The user manual, quality control procedure and results, technical information and contact information can be found in LabManager:
Process knowledge
- Phosphorus drive-in: look at the Dope with Phosphorus page
- Oxidation: look at the Oxidation page
- Annealing: look at the Annealing page
Purpose | Drive-in of phosphor, oxidation of silicon and annealing of the oxide. | Oxidation:
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Performance | Film thickness |
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Process parameter range | Process Temperature |
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Process pressure |
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Gasses on the system |
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Substrates | Batch size |
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Substrate material allowed |
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