Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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'''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G TAP300Al-G]''' for Tapping mode | '''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G TAP300Al-G]''' for Tapping mode | ||
|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or | |'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or | ||
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | '''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' <br> | ||
or '''[https://www.brukerafmprobes.com/p-4050-pfdt350.aspx PFDT350 for ScanAsyst mode] | or '''[https://www.brukerafmprobes.com/p-4050-pfdt350.aspx PFDT350 for ScanAsyst mode] | ||
|'''[https://www.brukerafmprobes.com/p-3693-snl-10.aspx SNL]''' | |'''[https://www.brukerafmprobes.com/p-3693-snl-10.aspx SNL]''' | ||