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'''Overview over some Processes available at DTU Nanolab'''
''Drawings in this section done by Jesper Hanberg @DTU Nanolab''
{| border="2" cellspacing="0" cellpadding="10" align="left"


'''🔬Structural and Morphological Properties:'''
|-
| width="150" align="center" style="color:black" | Surface Toppography  [[image:dummy.png|130px|frameless|link=Specific Process Knowledge/Wafer cleaning|Analysis of form, shape, size, structure, and surface features including surface roughness.]]
| width="150" align="center" style="color:black"| Chemical Composition and Molecular Interaction [[image:dummy.png|130px|frameless|link=Specific Process Knowledge/Wafer and sample drying|Identication of elemental composition and chemical states as well as molecular interactions.]]
| width="150" align="center" style="color:black"| Mechanical Properties [[image:dummy.png|130px|frameless|link=Specific Process Knowledge/Thin film deposition|These techniques measure hardness, elasticity, and stress.]]
|-


These methods reveal the shape, size, surface features, and internal structure of materials.
|-
 
| width="150" align="center" style="color:black"| Optical Properties [[image:dummy.png|130px|frameless|link=Specific Process Knowledge/Doping]]
* Microscopy techniques: light microscopy, SEM; TEM, AFM
| width="150" align="center" style="color:black"| Electrical Properties [[image:dummy.png|130px|frameless|link=Specific Process Knowledge/Thermal Process]]
* X-ray Techniques: XRD
| width="150" align="center" style="color:black"| Thermal Properties [[image:dummy.png|130px|frameless|link=Specific Process Knowledge/Pattern Design]]
* Others: FIB, Ellipsometry, etc
|-
 
|}
 
<br>
'''⚛️Chemical Composition:'''
<br clear="all">
 
These techniques identify elemental composition and chemical states.
 
* Spectroscopy Techniques:
** EDS/EDX (Energy Dispersive X-ray Spectroscopy) – elemental analysis (often with SEM)
** XPS (X-ray Photoelectron Spectroscopy) – surface chemistry and oxidation states
** SIMS (Secondary Ion Mass Spectrometry) – depth profiling and trace elements - not available at DTU Nanolab
** Raman Spectroscopy – vibrational modes, material identification - not available at DTU Nanolab
 
 
'''⚡Electrical Characterization: four-point probe'''
 
Used to evaluate conductivity, resistivity, and carrier behavior. 
 
'''🔥 Thermal Properties''' 
 
These methods assess how materials respond to heat.
 
'''🧲 Magnetic Properties''' 
 
Important for spintronics and magnetic storage applications. 
 
'''🧱 Mechanical Properties''' 
 
These techniques measure hardness, elasticity, and stress. 
 
* Special modes in AFM: Nanoindentation, Force Modulation Mode, ect
* Stylus profilometer (bending, thin film stress) 
 
'''🔬 Optical Properties'''
 
* ellipsometry?
* transmission ...


== Special Requirements ==
== Special Requirements ==
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