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Specific Process Knowledge/Pattern Design: Difference between revisions

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===Alignment marks===
===Alignment marks===
The following alignment marks are suggested to use on the Mask aligners for good pattern recognition. Pleased be adviced that they can be removed in KOH etching.
The following alignment marks are suggested to use on the Mask aligners for good pattern recognition. Pleased be adviced that they can be removed in KOH etching.
*[[Media:Alignmentkeys1.cif|Alignment marks 1 .cif]] (Right click and Use "save link as...") - ''You need the program "Clewin" to open this file''
*Mask aligner:
*[[Media:Alignmentkeys1.tdb|Alignment marks 1 .tdb]] - ''You need the program "L-Edit" to open this file''
**[[Media:Alignmentkeys1.cif|Alignment marks 1 .cif]] (Right click and Use "save link as...") - ''You need the program "Clewin" to open this file''
**[[Media:Alignmentkeys1.tdb|Alignment marks 1 .tdb]] - ''You need the program "L-Edit" to open this file''
*Maskless aligner:
**[[Media:MLA_AlignmentMarks_simple.gds|Simple alignment marks (.gds)]]
**[[Media:MLA_alignmentMarks_arrows.gds|Alignment marks with structures to assist in locating the marks during alignment (.gds)]]
**[[Media:AlignmentMark_KOH.gds|Alignment mark for multiple layers, Layer 1 for etch in KOH (.gds)]]


====Alignment marks location====
====Alignment marks location====