Specific Process Knowledge/Characterization/Profiler: Difference between revisions

Revision as of 14:33, 12 January 2024 view source Reet (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab347-labadviser-users-35231 1,736 edits →Equipment performance and process related parameters ← Older edit		Revision as of 14:33, 12 January 2024 view source Reet (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab347-labadviser-users-35231 1,736 edits m →Stylus Profiler: Dektak150 Newer edit →
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	[[image:Dektak150.JPG\|300x300px\|right\|thumb\|Stylus profiler:Dektak150, currently located in building 451, room 913 (as of 2023).]]		[[image:Dektak150.JPG\|300x300px\|right\|thumb\|Stylus profiler:Dektak150, currently located in building 451, room 913 (as of 2023).]]

	The stylus profiler Dektak150 is intended for profile measurements on samples outside the cleanroom. The ~~Dekta150~~ is especially well suited for measuring soft samples as it can be adjusted to apply lower force than the other stylus profilers at Nanolab.		The stylus profiler Dektak150 is intended for profile measurements on samples outside the cleanroom. The Dektak150 is especially well suited for measuring soft samples as it can be adjusted to apply lower force than the other stylus profilers at Nanolab.