LabAdviser/314/Microscopy 314-307/SEM: Difference between revisions
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Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or | Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondary generated electrons are collected on a detector. Depending on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | ||
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| align="center" width="200px" | '''QFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/QFEG|QFEG ]] | | align="center" width="200px" | '''QFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/QFEG|QFEG ]] | ||
| align="center" width="200px" | '''AFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/AFEG|AFEG ]] | | align="center" width="200px" | '''AFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/AFEG|AFEG ]] | ||
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| align="center" width="200px" | '''Helios''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Helios|Helios ]] | | align="center" width="200px" | '''Helios''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Helios|Helios ]] | ||
| align="center" width="200px" | '''Hydra''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Hydra|Hydra ]] | | align="center" width="200px" | '''Hydra''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Hydra|Hydra ]] | ||