Specific Process Knowledge/Characterization/XRD/XRD Powder/Measurement tips: Difference between revisions
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==Choosing measurement parameters== | ==Choosing measurement parameters== | ||
... | Some helpful tips can now be found in the [https://labmanager.dtu.dk/d4Show.php?id=6584&mach=463#dafs72253 manual on LabManager], section 4. They are mostly copied from the XRDMP Creater help document, which we for copyright reasons cannot make available here. | ||
.... "at | A detailed manual on the Aeris XRD is found online on the [https://wiki.iodp.tamu.edu/display/LMUG/Aeris+Advanced+User+Guide wiki of the International Ocean Discovery Project]. It also has helpful hints on adjusting the hardware including choices on beam knife height and slit size. It also has some pictures from the XRDMP Creator software. A useful nugget of info from there which you will not find in our manual concerns the beam knife position: ..."Scanning at angles less than 5° 2θ you will need to lower the knife (anti scatter)." | ||
==Fluorescence suppression== | |||
It is possible to adjust the Pulse Height Discrimination levels of the Pixcel 1D detector on our machine. This can help suppress signal from fluorescence, which is at a slightly different energy level than the pure copper K-alpha signal. The exact energy level of the fluorescence of course depends on the material you are measuring. | |||
Here is a comparison of a measurement with and without fluorescence suppression: | |||
[[File:fluoresc supp feoh.png|400px|caption:FeOH measured with and without fluorescence suppression.]] | |||