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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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!Recommended mode
!Recommended mode
|Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend '''ScanAsyst mode''' because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. However it also works fine in tapping mode.
|Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend '''ScanAsyst mode''' because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. However it also works fine in tapping mode.
|For Topographic measurements with no steep/abrupt steps we also recommend '''Tapping mode''' on most samples. Only on very soft samples (e.g. cells) we recommend ScanAsyst due to less chance of (non-uniform) deformation of the sample - or if you need QNM data. We mainly recommend '''Tapping mode''' because we experience less problems when the tip end is slightly broken.  
|For Topographic measurements with no steep/abrupt steps we also recommend '''Tapping mode''' on most samples. Only on very soft samples (e.g. cells) we recommend ''ScanAsyst'' due to less chance of (non-uniform) deformation of the sample - or if you need QNM data. We mainly recommend '''Tapping mode''' because we experience less problems when the tip end is slightly broken.  
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' or '''ScanAsyst mode" .  
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' or '''ScanAsyst mode" .  
|For High aspect ratio measurements we recommend Tapping mode. We do not have experience with ScanAsyst therefore we recommend '''Tapping mode'''.
|For High aspect ratio measurements we recommend Tapping mode. We do not have experience with ScanAsyst therefore we recommend '''Tapping mode'''.
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