Specific Process Knowledge/Lithography/EBeamLithography/FirstEBL: Difference between revisions
Appearance
| Line 283: | Line 283: | ||
*In '''Shot shape display''' check off '''Field boundary, Colored shot rank, Fill in a pattern''' and choose '''ASD''' on the '''Shot form''' drop down | *In '''Shot shape display''' check off '''Field boundary, Colored shot rank, Fill in a pattern''' and choose '''ASD''' on the '''Shot form''' drop down | ||
*The pattern is now visible and one can zoom in to see individual beam shots and how they overlap with the selected scan pitch | *The pattern is now visible and one can zoom in to see individual beam shots and how they overlap with the selected scan pitch | ||
*Once verified, close '''Shot shape display''' and '''Array check program''' | |||
{| style="border: none; border-spacing: 0; margin: 1em auto; text-align: center;" | {| style="border: none; border-spacing: 0; margin: 1em auto; text-align: center;" | ||