Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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===Demonstrating roughness measurements on silicon=== | ===Demonstrating roughness measurements on silicon=== | ||
#ScanAsyst with ScanAsyst-air | *#ScanAsyst with ScanAsyst-air | ||
*CL on | *CL on | ||
*512x512 | *512x512 | ||