Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

← Older editNewer edit →
VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,301 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,301 edits
Line 171: Line 171:
256 lines <br>
256 lines <br>
Z range at 2my to get sub nanometer resolution in Z <br>
Z range at 2my to get sub nanometer resolution in Z <br>
Rq: 54,5pm (plade vibrator koerte udenfor)  <br>
[[Image:System noise.JPG|400px]]
Rq: 23pm uden vibrator koerende + ro og med aaben hood. <br>
Rq:71pm uden vibrator koerende + ro og med lukket hood <br>
[[File:SystemNoise.jpg|thumb|left|400px]][[File:systemNoise_open_closed_hood.jpg|thumb|left|400px]]
<br clear="all" />
<br clear="all" />


Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/AFM_Icon_Acceptance"