Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

← Older editNewer edit →
VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Line 199: Line 199:
Z range 0.2my <br>
Z range 0.2my <br>
Scan size 0.01nm <br>
Scan size 0.01nm <br>
Roughness: Rq 27 pm (specs 35pm) <br>
Roughness: Rq 28 pm (specs 35pm) <br>
[[Image:scanner noise.JPG|400px]]
[[Image:scanner noise.JPG|400px]]
<br clear="all" />
 
<br clear="all" />


====System noise====
====System noise====
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/AFM_Icon_Acceptance"