Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions
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Roughness: Rq 27 pm (specs 35pm) <br> | Roughness: Rq 27 pm (specs 35pm) <br> | ||
[Image:scanner noise.JPG|400px] | [[Image:scanner noise.JPG|400px]] | ||
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