Specific Process Knowledge/Thin film deposition: Difference between revisions
→Choose material to deposit: created ITO page |
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[[/Deposition of Alumina|Aluminium Oxide (Al<sub>2</sub>O<sub>3</sub>)]]<br/> | |||
[[/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Process information|Barium titanate (BaTiO<sub>3</sub>)]]<br/> | |||
[[/Lesker|Chromium Oxide (Cr<sub>2</sub>O<sub>3</sub>)]]<br/> | |||
[[/Deposition of Hafnium Oxide|Hafnium Oxide (HfO<sub>2</sub>)]]<br/> | |||
[[/Deposition of Silicon Oxide|Silicon Oxide (SiO<sub>2</sub>)]]<br/> | [[/Deposition of Silicon Oxide|Silicon Oxide (SiO<sub>2</sub>)]]<br/> | ||
[[/Deposition of Titanium Oxide|Titanium Oxide (TiO<sub>2</sub>)]]<br/> | [[/Deposition of Titanium Oxide|Titanium Oxide (TiO<sub>2</sub>)]]<br/> | ||
[[/Lesker|Tantalum Oxide (Ta<sub>2</sub>O<sub>5</sub>)]]<br/> | [[/Lesker|Tantalum Oxide (Ta<sub>2</sub>O<sub>5</sub>)]]<br/> | ||
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[[/Lesker|AlCu]]<br/> | [[/Lesker|AlCu]]<br/> | ||
[[/Lesker|CoFe]]<br/> | [[/Lesker|CoFe]]<br/> | ||
[[/Lesker|CuTi]]<br/> | [[/Lesker|CuTi]]<br/> | ||
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[[/Deposition of NiV|NiV]] alloy <br/> | [[/Deposition of NiV|NiV]] alloy <br/> | ||
[[/Deposition of TiW|TiW]] alloy (10%/90% by weight) <br/> | [[/Deposition of TiW|TiW]] alloy (10%/90% by weight) <br/> | ||
And an electroceramic: | |||
[[/Lesker|YSZ]] (Yttrium stabilized zirconia)<br/> | [[/Lesker|YSZ]] (Yttrium stabilized zirconia)<br/> | ||
Revision as of 10:14, 22 April 2020
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Choose material to deposit
Dielectrica | Semicondutors | Metals | Nitrides | Alloys | Transparent conductive oxides | Polymers |
Aluminium Oxide (Al2O3) |
Aluminium
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Silicon Nitride - and oxynitride |
AlCu And an electroceramic: YSZ (Yttrium stabilized zirconia) |
ITO (Tin doped Indium Oxide) |
SU-8 |
Choose deposition equipment
PVD | LPCVD | PECVD | ALD | Coaters | Others
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See the Lithography/Coaters page for coating polymers |
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