Revision as of 09:44, 20 April 2020

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Electron Microscopy at DTU Nanolab building 314/307

At DTU Nanolab - building 314/307 are different types of microscopes available:


Transmission Electron Microscopy (TEM)	Scanning Electron Microscopy (SEM)	Dual-beam Electron Microcopes - Focused Ion Beam and Scanning Electron Microscope (FIB-SEM)

Depending on the equipment, different techniques are available:

THIS PAGE IS UNDER CONSTRUCTION


X-Ray spectroscopy (EDS/WDS)	Electron Energy Loss Spectroscopy (EELS)	Energy Filtered TEM (EFTEM)
Electron Backscatter Diffraction and Transmission Kikuchi Diffraction (EBSD/TKD)	Electron Holography


Available software at DTU Nanolab	Lattice fringe analysis

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 {| border="0" cellspacing="75" style="margin: auto;"
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-| align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Technique/EDS|EDS/WDS ]]
+| align="center" width="200px" heigth="250px" | '''X-Ray spectroscopy (EDS/WDS)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Technique/X-ray_spectroscopy|EDS/WDS ]]
 | align="center" width="200px" | '''Electron Energy Loss Spectroscopy (EELS)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Technique/EELS|EELS ]]
 | align="center" width="200px" | '''Energy Filtered TEM (EFTEM)''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/Technique/EFTEM|EFTEM ]]