Specific Process Knowledge/Characterization/XRD/XRD Powder: Difference between revisions
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|style="background:WhiteSmoke; color:black"|<b>XRD Powder</b> | |style="background:WhiteSmoke; color:black"|<b>XRD Powder</b> | ||
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Revision as of 16:16, 23 March 2020
THIS PAGE IS UNDER CONSTRUCTION
The XRD Powder setup
The "XRD powder" is a benchtop X-ray diffractometer from Panalytical for phase analysis of powders. It is located in the basement of building 346 at Nanolab, Room 904.
The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:
| Equipment | XRD Powder | |
|---|---|---|
| Purpose | Crystal structure analysis and thin film thickness measurement |
|
| X-ray generator |
Maximum rated output |
600 W |
|
Rated tube voltage |
40 kV | |
|
Rated tube current |
15 mA | |
|
Type |
Sealed tube | |
|
Target |
Cu | |
|
Focus size |
0.4 mm x 12 mm (Line) | |
| Goniometer |
Scanning mode |
incident / receiver coupled |
|
Goniomenter radius |
145 mm | |
|
Minimum step size |
0.001° (3.6") | |
|
Sample stage |
Fixed with rotation | |
|
Sample size |
Powders | |
| Optics | Incident side |
|
| Receiver side |
| |
| Substrates | Substrate size |
Only for powders |
| Allowed materials |
All materials have to be approved | |