Specific Process Knowledge/Thin film deposition/thermalevaporator: Difference between revisions
Appearance
m →Quality control (QC) procedure for the Thermal evaporator 70px: corrected qc parameters |
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| Line 115: | Line 115: | ||
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|Deposition rate | |Deposition rate | ||
| | |1 Å/s | ||
|5 Å/s | |5 Å/s | ||
|- | |- | ||
|Thickness | |Thickness | ||
| | |150 nm | ||
| | |150 nm | ||
|- | |- | ||
|Pressure | |Pressure | ||
| Line 133: | Line 133: | ||
|- | |- | ||
|Deposition rate deviation | |Deposition rate deviation | ||
|± | |± 50 % after stabilizing | ||
|- | |- | ||
|Measured average thickness | |Measured average thickness | ||