Specific Process Knowledge/Thin film deposition/Temescal: Difference between revisions
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|Thickness deviation across a 4" wafer | |Thickness deviation across a 4" wafer | ||
| | |± 5 % | ||
|- | |- | ||
|Deposition rate deviation | |Deposition rate deviation | ||
| | |± 20 % | ||
|- | |- | ||
|} | |} | ||