Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or | |'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or | ||
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | '''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | ||
| | |'''[https://www.brukerafmprobes.com/p-3693-snl-10.aspx]''' | ||
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|'''TappingMode 300nm trench''' (for steps <~1µm) | |'''TappingMode 300nm trench''' (for steps <~1µm) | ||
'''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm) | '''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm) | ||
|'''Standard Contact mode''' | |||
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